The Element Series VC20 probe card is a highly adaptable solution for a wide variety of tests.
Easily use the VC20 in different adapters, or quickly change probe cards for reconfigured
wafer layouts in modeling & characterization, wafer level reliability, or parametric test.
Maximum channel count: 48
Tester platforms: Keysight 4062, 4072, 4080, Keithley S600, S530, Rack and Stack configurations.
Minimum Pad Size: 30ux30u (tunable scrub)
Contact Resistance: less than 1 ohm
Temperature range: -65C to 200C
Leakage: Less than 5 femto Amps per volt
Repairable
Lifetime Performance: Production customers are experiencing 10M+ million touchdowns on Aluminum and Copper pads. Few to no rebuilds due to pobe wear
