Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
The 40 mm tile was designed for mounting on a standard 4.5″ probe card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
40 millimeter ceramic probe card
Optimized for DC parametric test and single site WLR
Compatible with standard 4.5″ rectangular edge card holders
Temperature compensated for use from-65°C to 300°C
Extended temperature option to 600°C
Sub-fA level leakage measurements available
Compatible with quick disconnect triaxial cable harnesses
Quasi-Kelvin connections available
Several connector options available
