Can test a variety of semiconductor materials
Standard configuration to carry out low temperature test,
Equipped with variable temperature test function, can be 90K ~ 500K test
Probe approach to contact, can be directly tested or do the electrode surface can be tested
Current output range 100nA - 19.9mA
Current source compatible voltage 20V
Input voltage range of ± 6V
Voltage Measurement Mode AC (213Hz) / DC
Voltage signal input coaxial
Voltage contact switching FET
Resistance test range 10-4 Ω / sq ~ 106Ω / sq
Carrier concentration test range 106 ~ 1021 cm-3
Carrier mobility test range 1 ~ 107 cm2 / V.s
Contact method probe direct contact
HL5500 / M50
Class reversible permanent magnet
Intensity 0.5T (5000 Gauss), nominal ± 1%
Stability Stability 0.1% over 10 years
Uniformity uniformity ± 0.1%
Maximum role of diameter 25mm
