APS 80 HV automatic prober for 2-inch to 8-inch wafers, Advanced automation for high volume, high voltage probing applications requiring special handling, such
as GaAs, saw frames, Taiko wafers, ceramics and silicon Power device
Low Contact Resistance MeasurementsHigh Current (up to 100A)
High Voltage (in excess of 10,000V) Safety Interlocks
configured to be used with Agilent’s B1505A Power Device Analyzer/ LEMSYS IGBT static tester
Temperature chuck, -55C to 200°C
Taiko chuck with integrated load mechanism, wafer size dependant
