Robust and stable prober ideal for diverse applications such as small geometry probing, applications using high power optics, design debug, wafer level reliability (WLR) and electro static discharge (ESD)
travel :210 mm X 340 mm
travel :310 mm X 400 mm
electroless nickel-plated aluminum
Manual, motorized or programmable microscope mount
Lasers for semiconductor failure analysis
Package device holder
Vacuum manifold
Probe card holder
Chuck plates
ShieldMaster™ environmental chamber
