Thin flim metrology system

  • Product No:FilmTek 1500
  • Manufacturer:Scientific Computing International

Spectral reflectance spectroscopy was used to generate visible light by using a built-in white light source. After the visible light was split by a grating, it was focused into a beam of less than 2 mm and vertically irradiated on the sample under test. The reflectance and transmission spectra were obtained by a CCD detector membrane thickness.    


  • Film thickness test range: 10nm-150um

  • Film thickness test accuracy: 0.2nm, NIST standard oxide film

  • Reflectivity and transmissivity test repeatability 0.01% at 600 nm

  • Spectral range: 380nm-950nm

  • Test area diameter: 1mm

  • Sample size: 2mm to 300mm standard

  • Spectral resolution: 0.2nm

  • Light source: Regulated tungsten-halogen lamp (10,000 hrs lifetime)

  • Detector: 3648 pixel Toshiba linear CCD array

  • Test time: <1 sec per site (e.g., oxide film)

  • Data acquisition time: 0.2 sec